Nearfield Instruments is a leading provider of advanced metrology solutions for the semiconductor industry. The company specializes in non-destructive, high-throughput 3D atomic force microscopy, enabling precise measurement of nanoscale structures in semiconductor manufacturing.

Founded in 2016 as a spin-off from TNO, Nearfield Instruments is headquartered in Rotterdam, the Netherlands. Their flagship product, the QUADRA system, is used for advanced metrology in high-volume manufacturing environments, ensuring the accuracy and reliability of complex semiconductor devices.

Nearfield Instruments' technology addresses the growing complexity of semiconductor devices, particularly those used in artificial intelligence applications. By providing real-time, non-destructive measurements, the company helps manufacturers improve yield, reduce waste, and enhance the performance of next-generation chips.

The Metrology Tower in Delft is a central hub for innovation and development. The building unite various organizations and areas of expertise under one roof, accelerating collaboration and progress.